R. Séfel: search on Z-Library

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1

Extension of the upper measuring limit in out-of plane deformation measurement by combination of digital holography and desensitized electronic speckle pattern interferometry

Séfel, Richárd

Journal:

Optical Engineering

Year:

2010

Language:

english

File:

PDF, 846 KB

english, 2010

2

Comparative electronic speckle pattern interferometry using adaptive holographic illumination

Séfel, Richárd

Journal:

Optical Engineering

Year:

2011

Language:

english

File:

PDF, 515 KB

english, 2011

3

Full field deformation measurement of centimeter sized objects using optical phase retrieval

B. Gombkötő, R. Séfel, J. Kornis

Journal:

Optics Communications

Year:

2011

Language:

english

File:

PDF, 793 KB

english, 2011

4

Examination of the upper measurement limit in displacement measurement using fringe compensation in digital holography

Richárd Séfel, János Kornis

Journal:

Optics Communications

Year:

2011

Language:

english

File:

PDF, 1.00 MB

english, 2011

5

Double-exposure phase calculation method in electronic speckle pattern interferometry based on holographic object illumination

Séfel, Richárd, Kornis, János

Journal:

Year:

2011

Language:

english

File:

PDF, 574 KB

english, 2011

6

SPIE Proceedings [SPIE SPIE Europe Optical Metrology - Munich, Germany (Monday 15 June 2009)] Optical Measurement Systems for Industrial Inspection VI - Automated compensation of fringe pattern in digital holography and TV holography

Kornis, János, Lehmann, Peter H., Séfel, Richárd

Year:

2009

Language:

english

File:

PDF, 2.79 MB

english, 2009

7

SPIE Proceedings [SPIE SPIE Europe Optics + Optoelectronics - Prague, Czech Republic (Monday 20 April 2009)] Holography: Advances and Modern Trends - Deformation and shape measurement by compensation in digital holography

Séfel, Richárd, Miler, Miroslav, Hrabovský, Miroslav, Kornis, János

Year:

2009

Language:

english

File:

PDF, 1.12 MB

english, 2009

8

SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 7 April 2008)] Optical Micro- and Nanometrology in Microsystems Technology II - Adaptive measurement of deformation and shape by compensation using TV holography and digital holography

Kornis, János, Gorecki, Christophe, Asundi, Anand K., Béki, Bence, Séfel, Richárd, Osten, Wolfgang

Year:

2008

Language:

english

File:

PDF, 1.05 MB

english, 2008

9

SPIE Proceedings [SPIE SPECKLE 2012: V International Conference on Speckle Metrology - Vigo, Spain (Monday 10 September 2012)] Speckle 2012: V International Conference on Speckle Metrology - Extension of the measuring range in deformation measurement using artificial phase compensation

Kornis, János, Séfel, Richárd, Doval, Ángel F., Trillo, Cristina

Year:

2012

Language:

english

File:

PDF, 2.00 MB

english, 2012

10

SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Monday 23 May 2011)] Optical Measurement Systems for Industrial Inspection VII - Adaptive holographic illumination in comparative electronic speckle pattern interferometry

Séfel, Richárd, Lehmann, Peter H., Osten, Wolfgang, Kornis, János, Varga-Fogarasi, Szilvia, Gastinger, Kay

Year:

2011

Language:

english

File:

PDF, 2.88 MB

english, 2011

11

SPIE Proceedings [SPIE OPTO - San Francisco, California (Saturday 23 January 2010)] Practical Holography XXIV: Materials and Applications - Application of holographic optical elements in active interferometers for nondestructive testing

Kornis, János, Bjelkhagen, Hans I., Kostuk, Raymond K., Séfel, Richárd

Year:

2010

Language:

english

File:

PDF, 11.59 MB

english, 2010